X-Ray Diffractometry

X-ray diffractometry (XRD) is a method for investigation of material properties for crystalline and nano-crystalline materials. This includes qualitative and quantitative phase composition as well as structural parameters of individual phases. XRD utilizes the phenomenon of inelastic scattering of X-rays by the periodic array of atoms within the crystal lattice.

In addition to room temperature analytics, material properties can be investigated in-situ in a high-temperature chamber (HTK1200 Anton Paar). Maximum temperature is 1200°C and samples can be measured in air, N2 and vacuum. Such measurements are used for monitoring of crystallization and re-crystallization processes, determination of thermal properties (expansion coefficient, density, structure parameter) and for the investigation of thermal-induced phase transformations.